Paper
21 March 2000 Access round-view datacloud for three-dimensional vision inspection applications
Huicheng Zhou, Jihong Chen, Daoshan Yang, Ji Zhou, Shawn Buckley
Author Affiliations +
Abstract
In 3D inspection applications, a round-view datacloud rather than range data is needed to access the dimensions of an industrial part. This paper discusses how to acquire the round-view datacloud of a part with a structured light machine vision (SLMV) scanner. The SLMV system consists of a line- structured laser, scanning means, image grabber and computer. In this scanning system, the part to be inspected is held on a turntable to sequentially expose different sides of the part to the scanner. For each side off the part, range data is found by triangulation means. Combining range data captured from different sides into a single composite produces a more complete datacloud description of the part's surfaces. Many more dimensions of a typical part can be inspected by analyzing the composite datacloud. The scanning process is divided into two phases: part rotation and surface scanning. Once the turntable is rotated to a specified position, the laser scans the part surfaces available in that position. Data points captured from different positions are merged into one composite datacloud according to a previously found rotational center.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huicheng Zhou, Jihong Chen, Daoshan Yang, Ji Zhou, and Shawn Buckley "Access round-view datacloud for three-dimensional vision inspection applications", Proc. SPIE 3966, Machine Vision Applications in Industrial Inspection VIII, (21 March 2000); https://doi.org/10.1117/12.380063
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Inspection

Cameras

Composites

3D vision

Machine vision

3D metrology

Scanners

RELATED CONTENT

Extrinsic calibration of single-scanline range sensor
Proceedings of SPIE (January 04 1995)
Miniature variable scan camera for machine vision
Proceedings of SPIE (May 20 1993)
Digital moire applications in automated inspection
Proceedings of SPIE (October 03 1994)
The promise and payoff of 2D and 3D machine vision...
Proceedings of SPIE (February 26 2004)

Back to Top