Paper
25 April 2000 Determination of the x-ray intensity pattern in mammography with very high-spatial resolution
Christoph Hoeschen, Andreas Fessel, Egbert Buhr, Wilfried Doehring M.D.
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Abstract
There is a lot of effort to develop digital detectors for mammography, for example for the screening programs. For this development it would be very helpful to know, which structure sizes have to be reproduced. Besides that, the information content of images produced by digital systems may be influenced by aliasing artifacts, if there are frequency components in the incoming signal higher than the Nyquist- frequency of the detector. Therefore the spatially modulated pattern of the X-ray intensity in a mammogram has to be known, but so far only little information is available. The method to measure and analyze the X-ray intensity pattern of a radiograph of the thorax in the detector plane which was presented at 'Medical Imaging' conference last year has been further developed in a way, that it meets the requirements for determining the intensity pattern in mammography.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christoph Hoeschen, Andreas Fessel, Egbert Buhr, and Wilfried Doehring M.D. "Determination of the x-ray intensity pattern in mammography with very high-spatial resolution", Proc. SPIE 3977, Medical Imaging 2000: Physics of Medical Imaging, (25 April 2000); https://doi.org/10.1117/12.384496
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Cited by 4 scholarly publications.
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KEYWORDS
X-rays

X-ray imaging

Mammography

Scanners

Breast

Digital mammography

Sensors

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