Paper
25 April 2000 Recursive correction algorithm for detector decay characteristics in CT
Author Affiliations +
Abstract
Many studies have been conducted on the utilization of solid state detectors for computed tomography (CT). One of the important performance parameters for the solid state detector has been shown to be the primary speed and afterglow. In this paper, we present a detailed investigation on the signal decay characteristics of the HiLightTM scintillating detector. We first develop an analytical model to fully characterize the detector impulse response. The model sensitivity to x-ray photon energy, detector aging, and radiation exposure is then established and analyzed. The impact of various decay time constants on CT image quality is subsequently illustrated with computer simulations and phantom experiments. Finally, a recursive correction approach is derived and evaluated.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jiang Hsieh, O. E. Gurmen, and Kevin F. King "Recursive correction algorithm for detector decay characteristics in CT", Proc. SPIE 3977, Medical Imaging 2000: Physics of Medical Imaging, (25 April 2000); https://doi.org/10.1117/12.384505
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Cited by 21 scholarly publications.
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KEYWORDS
Sensors

X-rays

Signal detection

Image quality

X-ray detectors

Spatial resolution

Solid state electronics

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