Solid state laser devices of optical metrology

Andrzej Dlugaszek; Anatoliy I. Khizhnyak; Igor I. Peshko; Wojciech Skrzeczanowski

doi:10.1117/12.373739

13 December 1999 Solid state laser devices of optical metrology

Andrzej Dlugaszek, Anatoliy I. Khizhnyak, Igor I. Peshko, Wojciech Skrzeczanowski

Proceedings Volume 4018, Optoelectronic Metrology; (1999) https://doi.org/10.1117/12.373739
Event: Optoelectronic Metrology, 1998, Lancut, Poland

Abstract

A review of solid-state lasers used in optical metrology is presented. Various sources of laser parameters instabilities are discussed. Methods of laser output parameters stabilization are proposed. The solutions for Nd:YAG, Ti:sapphire, semiconductor, glass and fiber lasers are shortly presented and discussed. Possibilities and perspectives of use of different laser systems as standards for energy, power or frequency units are also shown.

Citation Download Citation

Andrzej Dlugaszek, Anatoliy I. Khizhnyak, Igor I. Peshko, and Wojciech Skrzeczanowski "Solid state laser devices of optical metrology", Proc. SPIE 4018, Optoelectronic Metrology, (13 December 1999); https://doi.org/10.1117/12.373739

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available