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10 April 2000 Design and fabrication of a novel thermally actuated vertical bimorph scanner for an integrated AFM
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Proceedings Volume 4019, Design, Test, Integration, and Packaging of MEMS/MOEMS; (2000) https://doi.org/10.1117/12.382279
Event: Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS, 2000, Paris, France
Abstract
This paper presents the concept and design of a new lateral scanning system for an integrated atomic force microscope (AFM). The core part of the scanner is formed by vertical bimorph beams, which are reported for the first time in this paper. They consist of silicon beams side-coated with aluminium, which bend upon heating causing movement in the horizontal plane. Combining vertical bimorphs with planar bimorphs allows three-dimensional actuation. Theoretical analyses comprising electro-thermal and thermo-eleastic calculations show that large actuation movements are possible at low electrical input power and low input voltage. A process has been developed to deposit aluminium onto sidewalls of silicon beams. Furthermore, the fabrication process for the actuator is described.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Harald Sehr, Alan G. R. Evans, Arthur Brunnschweiler, and Graham J. Ensell "Design and fabrication of a novel thermally actuated vertical bimorph scanner for an integrated AFM", Proc. SPIE 4019, Design, Test, Integration, and Packaging of MEMS/MOEMS, (10 April 2000); https://doi.org/10.1117/12.382279
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