Display performance assessment and certification at NIDL

Ronald E. Enstrom; Michael D. Grote; Michael H. Brill

doi:10.1117/12.397764

28 August 2000 Display performance assessment and certification at NIDL

Ronald E. Enstrom, Michael D. Grote, Michael H. Brill

Proceedings Volume 4022, Cockpit Displays VII: Displays for Defense Applications; (2000) https://doi.org/10.1117/12.397764
Event: AeroSense 2000, 2000, Orlando, FL, United States

Abstract

The National Information Display Laboratory (NIDL) is chartered to ensure the most efficient and cost-effective transfer of display technologies to government applications. To assure high quality in displays acquired by the government, the NIDL conducts systematic measurement of candidate displays, guided by standards of metrology and performance. The NIDL also initiates and promulgates such standards, through bodies such as ISO, VESA, ANSI, PIMA, and IEC. This paper discusses three aspects of the quality-assurance program, which correspond to successive steps in monitor verification: (1) set up the monitor so it performs as well as possible; (2) measure it carefully in dimensions such as grayscale, color, and resolution; and (3) compare the measurements against acceptance criteria that are stringent but achievable. In each of these stages, objective measurements are supplemented (and sometimes replaced) by allowing humans to assess a variety of test patterns (some designed by NIDL). Subjective and objective tests each have advantages: human vision is the ultimate arbiter of display quality, but objective measurements are more standardizable than the judgements of individual observers. The best of both worlds would be a metric based on an objective model of human vision. Toward this goal, the NIDL has applied a vision model to display-quality problems (NIIRS prediction and impacts of screen reflection).

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Ronald E. Enstrom, Michael D. Grote, and Michael H. Brill "Display performance assessment and certification at NIDL", Proc. SPIE 4022, Cockpit Displays VII: Displays for Defense Applications, (28 August 2000); https://doi.org/10.1117/12.397764

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KEYWORDS

Standards development

LCDs

Visual process modeling

CRTs

Visualization

Projection systems

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