Noncontact laser metrology with real-time detection and high-speed processing for material analysis

Yunlu Zou; Tin M. Aye; Gajendra D. Savant; Andrew A. Kostrzewski; Dai Hyun Kim; Charles G. Pergantis

doi:10.1117/12.397799

5 September 2000 Noncontact laser metrology with real-time detection and high-speed processing for material analysis

Yunlu Zou, Tin M. Aye, Gajendra D. Savant, Andrew A. Kostrzewski, Dai Hyun Kim, Charles G. Pergantis

Proceedings Volume 4035, Laser Radar Technology and Applications V; (2000) https://doi.org/10.1117/12.397799
Event: AeroSense 2000, 2000, Orlando, FL, United States

Abstract

This paper describes the development of real-time non-contact metrology based on holographic interferometry and neural network fringe analysis software to detect defects in composite materials. The object under inspection is illuminated by a high-power solid-state laser, and the light scattered from the material surface is recorded in real time using a double-exposure holographic interferometer, which can detect minute surface deformation caused by defects in the material. Thermal stimulation of the object creates a non- uniform time-varying material reaction, which causes surface deformation that is characteristic of the material's internal structure. This deformation in turn creates time-varying interference patterns, which are recorded by a real-time holographic interferometric system and displayed on the computer monitor through a CCD camera. The system allows real- time, in-depth non-contact inspection of composite materials used in aircraft and other military vehicles. A genetic algorithm has also been developed for fast data processing in a non-laboratory environment. The sophisticated neural network recognizes the types of defects at high speed.

Citation Download Citation

Yunlu Zou, Tin M. Aye, Gajendra D. Savant, Andrew A. Kostrzewski, Dai Hyun Kim, and Charles G. Pergantis "Noncontact laser metrology with real-time detection and high-speed processing for material analysis", Proc. SPIE 4035, Laser Radar Technology and Applications V, (5 September 2000); https://doi.org/10.1117/12.397799

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available