Paper
22 August 2000 Theoretical study of microwave radiometry for buried object detection
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Abstract
An analytical study of environmental and clutter effects on microwave radiometers used for the detection of buried objects is presented. To simplify the analysis, it is assumed that the soil/target medium has a constant physical temperature versus depth, so that Kirchhoff's law can be applied to determine emissivities, and a simple layered medium geometry is used to model a buried target. Changes in brightness temperatures which result due to the present of a buried target are illustrated for varying soil dielectric properties, radiometer frequencies, and target depths, and are contrasted with changes in brightness temperatures which can occur when no target is presented due to slight soil moisture or soil temperature variations. Brightness temperature clutter due to a small surface roughness is also analytically modeled, through application of the small slope approximation for the homogeneous medium case and the small perturbation method in the presence of a subsurface layer, and it is shown that surface clutter effects can be mitigated through proper choice of sensor polarization and observation angle. Particular attention is given to the relationship between passive and active microwave sensors; results demonstrate that these two can provide complementary information. Finally, the use of wideband radiometric measurements are discussed as a means for reducing environmental clutter effects and improving detection algorithms.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joel Tidmore Johnson "Theoretical study of microwave radiometry for buried object detection", Proc. SPIE 4038, Detection and Remediation Technologies for Mines and Minelike Targets V, (22 August 2000); https://doi.org/10.1117/12.396256
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Cited by 7 scholarly publications.
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KEYWORDS
Soil science

Polarization

Radiometry

Microwave radiation

Temperature metrology

Surface roughness

Sensors

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