Paper
16 August 2000 Nanosecond interferometric studies of surface deformations of dielectrics induced by laser irradiation
Scott R. Greenfield, Joanna L. Casson, Aaron C. Koskelo
Author Affiliations +
Abstract
Transient surface deformations in dielectric materials induced by laser irradiation were investigated with time-resolved interferometry. Deformation images were acquired at various delay times after exposure to single pulses (100 ps at 1.064 micrometer) on fresh sample regions. Above the ablation threshold, we observe prompt ejection of material and the formation of a single unipolar compressional surface acoustic wave propagating away from the ablation crater. For calcite, no deformation -- either transient or permanent -- is discernable at laser fluences below the threshold for material ejection. Above and below-threshold behavior was investigated using a phosphate glass sample with substantial near infrared absorption (Schott filter KG3). Below threshold, KG3 exhibits the formation of a small bulge roughly the size of the laser spot that reaches its maximum amplitude by approximately 5 ns. By tens of nanoseconds, the deformations become quite complex and very sensitive to laser fluence. The above-threshold behavior of KG3 combines the ablation-induced surface acoustic wave seen in calcite with the bulge seen below threshold in KG3. A velocity of 2.97 +/- 0.03 km/s is measured for the KG3 surface acoustic wave, very close to the Rayleigh wave velocity calculated from material elastic parameters. Details of the transient interferometry system are also given.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Scott R. Greenfield, Joanna L. Casson, and Aaron C. Koskelo "Nanosecond interferometric studies of surface deformations of dielectrics induced by laser irradiation", Proc. SPIE 4065, High-Power Laser Ablation III, (16 August 2000); https://doi.org/10.1117/12.407380
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Cited by 7 scholarly publications.
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KEYWORDS
Calcite

Laser ablation

Interferometry

Absorption

Acoustics

Interferometers

Dielectrics

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