Paper
19 July 2000 ALTA 3700: extending the application space of the ALTA 3500 laser reticle writer
Cris G. Morgante, Henry Chris Hamaker
Author Affiliations +
Abstract
Critical dimension (CD) uniformity, stripe butting, and composite overlay results from incremental improvements in critical subsystems on the ALTA 3500 have been previously reported. Integrating those optimized subsystems with another major subsystem improvement in the recently introduced ALTA 3700 system has allowed laser reticle writers to address the needs of maskmakers in the 180 nm and 150 nm technology nodes. This paper presents the results of a redesigned acousto-optic modulator that addresses thermal- induced beam intensity variations, which have the potential to induce CD uniformity errors. In addition, studies on print-quality performance and throughput on masks that are representative of a true product show that the integrated performance of the ALTA 3700 system extends the performance of ALTA 3500 system.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cris G. Morgante and Henry Chris Hamaker "ALTA 3700: extending the application space of the ALTA 3500 laser reticle writer", Proc. SPIE 4066, Photomask and Next-Generation Lithography Mask Technology VII, (19 July 2000); https://doi.org/10.1117/12.392079
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CITATIONS
Cited by 1 scholarly publication and 2 patents.
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KEYWORDS
Bragg cells

Critical dimension metrology

Metrology

Reticles

Photoresist materials

Printing

Photomasks

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