SEM analysis of bimode photodeposition-ablation cycles on the structural changes of laser-irradiated a-Se thin films

Aaron Peled; N. Mirchin; D. Naot; I. Lapsker

doi:10.1117/12.378180

25 February 2000 SEM analysis of bimode photodeposition-ablation cycles on the structural changes of laser-irradiated a-Se thin films

Aaron Peled, N. Mirchin, D. Naot, I. Lapsker

Author Affiliations +

Proceedings Volume 4070, ALT '99 International Conference on Advanced Laser Technologies; (2000) https://doi.org/10.1117/12.378180
Event: ALT'99 International Conference: Advanced Laser Technologies, 1999, Potenza-Lecce, Italy

Abstract

Write and erase (WE) thin film patterns obtained by in-situ consecutive photodeposition and photoablation cycles were investigated. The submicrometric structures of photodeposited and photoablated amorphous Selenium(a-Se) thin films were examined by high resolution scanning electron microscope (SEM). Magnification up to X100,000 was used to establish the morphology of the particles and islands on the substrate before and after the ablation cycle. The SEM micrographs show that the disintegration of the film during the ablation process leads to the creation of a variety of structures such as islands and particles in the nano to micrometer range. The findings indicate that similar to island film growth, viscoelastic phenomena are involved in the observed morphology in the ablation zones.

Citation Download Citation

Aaron Peled, N. Mirchin, D. Naot, and I. Lapsker "SEM analysis of bimode photodeposition-ablation cycles on the structural changes of laser-irradiated a-Se thin films", Proc. SPIE 4070, ALT '99 International Conference on Advanced Laser Technologies, (25 February 2000); https://doi.org/10.1117/12.378180

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