Paper
24 May 2000 Tolerance stackup effects in optical interconnect systems
Frederic K. Lacroix, Andrew G. Kirk
Author Affiliations +
Proceedings Volume 4089, Optics in Computing 2000; (2000) https://doi.org/10.1117/12.386783
Event: 2000 International Topical Meeting on Optics in Computing (OC2000), 2000, Quebec City, Canada
Abstract
This paper presents a study of the effects of the accumulation of positioning errors across multiple optical components (also named `tolerance stackup') on the optical power throughput performance of free-space optical interconnects. It is shown that a sensitivity analysis is not adequate to establish a tolerance budget as it provides no information regarding the system yield upon assembly. The effects of tolerance stackup across a system are more severe than a statistical root-sum-square type analysis predicts. It is demonstrated that errors accumulate linearly with interconnect length.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Frederic K. Lacroix and Andrew G. Kirk "Tolerance stackup effects in optical interconnect systems", Proc. SPIE 4089, Optics in Computing 2000, (24 May 2000); https://doi.org/10.1117/12.386783
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KEYWORDS
Tolerancing

Optical interconnects

Sensors

Received signal strength

Monte Carlo methods

Microlens

Statistical analysis

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