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24 October 2000 Systems engineering analysis of image quality
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A linear systems approach (multiplying MTFs or convolving PSFs) to performing a complete systems engineering analysis of image quality is described. This includes not only the traditional diffraction analysis and the evaluation of image degradation from residual design errors: but also includes image degradation due to scattering effects from residual optical fabrication errors, assembly and alignment errors, and all other potential error sources appearing in a detailed error budget tree. The effects of mosaic detector arrays upon systems performance and the optimum system design will also be discussed. This analysis allows optical fabrication tolerances to be determined during the design phase of a program, frequently resulting in substantial cost and schedule savings. Inaccuracies in the linear systems assumption will be presented for several different applications.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James E. Harvey and Andrey Krywonos "Systems engineering analysis of image quality", Proc. SPIE 4093, Current Developments in Lens Design and Optical Systems Engineering, (24 October 2000);


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