Paper
26 September 2000 Light scattering by periodic roughness at dielectric surface
Vitali E. Gruzdev, Anastasia S. Gruzdeva
Author Affiliations +
Abstract
Numerical modelling is applied to investigation of scattering of plane linearly polarized monochromatic wave by sine variations of dielectric surface relief. The modelling is based on finite-different time-domain technique. Results of modelling include 1) space distribution of scattered light, 2) dependence of field amplification on ratio of roughness amplitude to laser wavelength, and 3) dependence of field amplification on ratio of roughness period to laser wavelength. Obtained results show that for TE polarization a) transmitted signal is more sensitive to roughness parameters than reflected on, b) there is narrow resonance in dependence of amplitude of scattered field on laser wavelength and roughness period, c) dependence of amplitude of scattered field on roughness amplitude is described by parabolic function for small values of relief amplitude. Depending on relief amplitude and period, scattering by sine roughness can result in formation of inhomogeneous space field distribution consisting of periodic field maxima inside dielectric or formation of homogeneous distribution such that both transmitted and reflected signals are close to plane wave. We consider the following applications of obtained results: 1) possibility to develop a new technique for in-situ surface roughness characterisation, and 2) anti-reflection effect.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vitali E. Gruzdev and Anastasia S. Gruzdeva "Light scattering by periodic roughness at dielectric surface", Proc. SPIE 4100, Scattering and Surface Roughness III, (26 September 2000); https://doi.org/10.1117/12.401652
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Light scattering

Dielectrics

Scattering

Laser scattering

Surface roughness

Dielectric polarization

Modeling

Back to Top