Infrared refractive index measurements using a new method

Di Yang; Michael E. Thomas; William J. Tropf; Simon G. Kaplan

doi:10.1117/12.403589

11 October 2000 Infrared refractive index measurements using a new method

Di Yang, Michael E. Thomas, William J. Tropf, Simon G. Kaplan

Proceedings Volume 4103, Optical Diagnostic Methods for Inorganic Materials II; (2000) https://doi.org/10.1117/12.403589
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

A complete independent method is used to measure the infrared refractive index of sapphire as a function of temperature and frequency. The technique combines single frequency and broadband measurements. The refractive index at the wavelength 3.39 (mu) m is measured using prism and the minimum deviation method. A laser interferometer and an etalon of the material are then used to measure the thermo-optic coefficient. A broadband FTIR spectrometer is used to measure the transmittance spectrum of the etalon and then a fringe counting method is applied to obtain the frequency dependent refractive index. The technique is applied to sapphire over the temperature range from 10K to 1000K and wavelength range from 1 to 5 (mu) m. High accuracy is demonstrated. The errors of this experimental approach are analyzed.

Citation Download Citation

Di Yang, Michael E. Thomas, William J. Tropf, and Simon G. Kaplan "Infrared refractive index measurements using a new method", Proc. SPIE 4103, Optical Diagnostic Methods for Inorganic Materials II, (11 October 2000); https://doi.org/10.1117/12.403589

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