Paper
6 July 2000 Nondestructive detection of defects in materials using microwaves
David Glay, Tuami Lasri, Ahmed Mamouni, Yves Leroy
Author Affiliations +
Abstract
The most commonly used nondestructive techniques for materials evaluation are ultrasonics, X and (gamma) -rays, infrared and eddy currents methods. In recent years, considerable efforts have been made in applying microwave techniques to test dielectric materials and metals. Therefore, for a few applications microwave methods can be considered alterative approaches to those conventional means. In this paper we consider the microwave near-field determination of the reflection coefficient of dielectric materials and metals, with varying size of flaws, for nondestructive testing purposes. These measurements and simulations are conducted at 35 GHz. We try to demonstrate that microwaves have their place as one tool in the toolbox of the practitioners.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David Glay, Tuami Lasri, Ahmed Mamouni, and Yves Leroy "Nondestructive detection of defects in materials using microwaves", Proc. SPIE 4129, Subsurface Sensing Technologies and Applications II, (6 July 2000); https://doi.org/10.1117/12.390622
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Microwave radiation

Metals

Dielectrics

Reflection

Antennas

Defect detection

Nondestructive evaluation

Back to Top