Paper
22 September 1983 Complex Reflectivity And Refractive Index Profiles From Reflectivity Magnitude Measurements
R. B. Goldner, T. F. Quatieri, M. N. Grimbergen
Author Affiliations +
Proceedings Volume 0413, Inverse Optics I; (1983) https://doi.org/10.1117/12.935845
Event: 1983 Technical Symposium East, 1983, Arlington, United States
Abstract
A problem of interest in thin film optics is to nondestructively measure one-dimensional refractive index profiles. We have been investigating the use of measurements of reflectivity magnitude as a function of incidence angle to determine such refractive index profiles. One approach is to use the Gel'fand Levitan algorithm as outlined by Moses and deRidderl. The algorithm requires knowledge of the Fourier transform of the complex reflectivity function. In this paper we present the results of computer testing an iterative technique for generating the complex reflectivity function from its magnitude and from appropriate constraints. The empirical results indicate that the iterative technique is capable of obtaining complex reflectivity estimates that could be within laboratory instrument generated uncertainty.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. B. Goldner, T. F. Quatieri, and M. N. Grimbergen "Complex Reflectivity And Refractive Index Profiles From Reflectivity Magnitude Measurements", Proc. SPIE 0413, Inverse Optics I, (22 September 1983); https://doi.org/10.1117/12.935845
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KEYWORDS
Reflectivity

Refractive index

Fourier transforms

Thin films

Inverse optics

Polarization

Reconstruction algorithms

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