Fabrication and testing of the IRS: the spectrograph on SIRTF

James R. Houck; Thomas L. Roellig; Jeff Van Cleve; Bernhard Rainer Brandl; K. Uchida

doi:10.1117/12.406574

16 November 2000 Fabrication and testing of the IRS: the spectrograph on SIRTF

James R. Houck, Thomas L. Roellig, Jeff Van Cleve, Bernhard Rainer Brandl, K. Uchida

Proceedings Volume 4131, Infrared Spaceborne Remote Sensing VIII; (2000) https://doi.org/10.1117/12.406574
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

The Infrared Spectrograph, IRS, for SIRTF is a set of four compact low and medium resolution infrared spectrographs designed to work in the wavelength range from 5.3 - 40 micrometers at resolutions, (lambda) /(Delta) (lambda) from 65 to 600. The design involves all reflecting optics with no moving parts. The basic design philosophy, the fabrication process, the test program, and the real-time pointing capabilities are discussed.

Citation Download Citation

James R. Houck, Thomas L. Roellig, Jeff Van Cleve, Bernhard Rainer Brandl, and K. Uchida "Fabrication and testing of the IRS: the spectrograph on SIRTF", Proc. SPIE 4131, Infrared Spaceborne Remote Sensing VIII, (16 November 2000); https://doi.org/10.1117/12.406574

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available