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16 November 2000 Fabrication and testing of the IRS: the spectrograph on SIRTF
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Abstract
The Infrared Spectrograph, IRS, for SIRTF is a set of four compact low and medium resolution infrared spectrographs designed to work in the wavelength range from 5.3 - 40 micrometers at resolutions, (lambda) /(Delta) (lambda) from 65 to 600. The design involves all reflecting optics with no moving parts. The basic design philosophy, the fabrication process, the test program, and the real-time pointing capabilities are discussed.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James R. Houck, Thomas L. Roellig, Jeff Van Cleve, Bernhard Rainer Brandl, and K. Uchida "Fabrication and testing of the IRS: the spectrograph on SIRTF", Proc. SPIE 4131, Infrared Spaceborne Remote Sensing VIII, (16 November 2000); https://doi.org/10.1117/12.406574
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