Fabrication and testing of the IRS: the spectrograph on SIRTF

James R. Houck; Thomas L. Roellig; Jeff Van Cleve; Bernhard Rainer Brandl; K. Uchida

doi:10.1117/12.406574

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16 November 2000 Fabrication and testing of the IRS: the spectrograph on SIRTF

James R. Houck, Thomas L. Roellig, Jeff Van Cleve, Bernhard Rainer Brandl, K. Uchida

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Proceedings Volume 4131, Infrared Spaceborne Remote Sensing VIII; (2000) https://doi.org/10.1117/12.406574
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

The Infrared Spectrograph, IRS, for SIRTF is a set of four compact low and medium resolution infrared spectrographs designed to work in the wavelength range from 5.3 - 40 micrometers at resolutions, (lambda) /(Delta) (lambda) from 65 to 600. The design involves all reflecting optics with no moving parts. The basic design philosophy, the fabrication process, the test program, and the real-time pointing capabilities are discussed.

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James R. Houck, Thomas L. Roellig, Jeff Van Cleve, Bernhard Rainer Brandl, and K. Uchida "Fabrication and testing of the IRS: the spectrograph on SIRTF", Proc. SPIE 4131, Infrared Spaceborne Remote Sensing VIII, (16 November 2000); https://doi.org/10.1117/12.406574

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