Half-wave infrared reflection retarders using two-dimensional ZnS surface-relief grating on Au substrate at 45-deg. angle of incidence

Jian Liu; Rasheed M. A. Azzam

doi:10.1117/12.406636

15 November 2000 Half-wave infrared reflection retarders using two-dimensional ZnS surface-relief grating on Au substrate at 45-deg. angle of incidence

Jian Liu, Rasheed M. A. Azzam

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Proceedings Volume 4133, Polarization Analysis, Measurement, and Remote Sensing III; (2000) https://doi.org/10.1117/12.406636
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

External-reflection phase retarders with high reflectance have been of interest for many years. 1-7 By selecting the angle of incidence, film thickness, and refractive indices of both the film and metallic substrate, the p- and s-polarized components of incident monochromatic light can be reflected equally and with a specified differential reflection phase shift introduced beween them. In general, these studies involved isotropic films. Azzam and Perilloux1 discussed the constraint on the optical constants of a film-substrate system such that it functions as a quarter-wave retarder (QWR) or half-wave retarder (HWR) at incidence angles of 70° and 45°, respectively.

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Jian Liu and Rasheed M. A. Azzam "Half-wave infrared reflection retarders using two-dimensional ZnS surface-relief grating on Au substrate at 45-deg. angle of incidence", Proc. SPIE 4133, Polarization Analysis, Measurement, and Remote Sensing III, (15 November 2000); https://doi.org/10.1117/12.406636

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KEYWORDS

Reflection

Reflectivity

Refractive index

Dielectrics

Gold

Wave plates

Zinc

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