High-order birefringence measurement using spectroscopic polarized light

Hiroyuki Kowa; Kanae Muraki; Yukitoshi Otani; Norihiro Umeda; Toru Yoshizawa

doi:10.1117/12.406620

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15 November 2000 High-order birefringence measurement using spectroscopic polarized light

Hiroyuki Kowa, Kanae Muraki, Yukitoshi Otani, Norihiro Umeda, Toru Yoshizawa

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Proceedings Volume 4133, Polarization Analysis, Measurement, and Remote Sensing III; (2000) https://doi.org/10.1117/12.406620
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

The paper covers an issue of method and device for measurement of two-dimensional retardance with high-order and azimuthal direction. The system based on the use of a crossed polarizer by changing spectroscopic polarized light. Sixty-four sets of images are used for birefringence analysis. The spectroscopic interferogram change sinusoidal with wave number and the period is in proportion to birefringence of specimen. The measured results of the two dimensional birefringence distribution of a plastic and standard phase plate of retardation are shown. Fourier transform method and maximum entropy method enable to measure birefringence with high resolution. Two examples, measurement of aligned polymer film, which is laminated as steps, and that of birefringence distribution, are demonstrated.

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Hiroyuki Kowa, Kanae Muraki, Yukitoshi Otani, Norihiro Umeda, and Toru Yoshizawa "High-order birefringence measurement using spectroscopic polarized light", Proc. SPIE 4133, Polarization Analysis, Measurement, and Remote Sensing III, (15 November 2000); https://doi.org/10.1117/12.406620

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