Paper
18 December 2000 High-energy x-ray and neutron modeling and digital imaging for nondestructive testing applications
Anthony W. Davis, Charles R. Hills, Matthew J. Sheats, Thomas N. Claytor
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Abstract
Adapting amorphous silicon imagers to the rigors of nondestructive evaluation has required the creation of new tools and techniques for successful detection of flaws in dense objects. At Los Alamos National Laboratory, extensive use of digital imagers and a desire to replace film with digital systems has led to additional research into modeling and simulation with an ultimate goal of improved techniques for using these imagers. The imagers have been used with varying success at x-ray energies ranging from 70 eV to 20 MeV, as well as with a variety of neutron energies at the Los Alamos Neutron Science Center. To simulate these diverse situations, a new version of the Monte Carlo Neutron/Photon Science Center. TO simulate these diverse situations, a new version of the Monte Carlo Neutron/Photon simulation package, developed at Los Alamos, is employed. The rapid simulation of various setups allows the rapid development of techniques without extensive and costly experimentation or test blocks. The simulations cover digital radiography as well as computed tomography. The results of these simulations leads to several techniques for digital radiology and computed tomography unique to amorphous silicon imagers, and provides additional information concerning advantage of amorphous silicon detector to provide density resolution in ways not possible with film. Also, the viability of amorphous silicon detectors at extremely high energies is simulated and tested experimentally.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anthony W. Davis, Charles R. Hills, Matthew J. Sheats, and Thomas N. Claytor "High-energy x-ray and neutron modeling and digital imaging for nondestructive testing applications", Proc. SPIE 4142, Penetrating Radiation Systems and Applications II, (18 December 2000); https://doi.org/10.1117/12.410552
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Sensors

Monte Carlo methods

Radiography

Digital imaging

Nondestructive evaluation

Amorphous silicon

X-rays

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