Phase-retrieval x-ray diffractometry in the case of high- or low-flux radiation source

Andrei Yurievich Nikulin; Peter Zaumseil

doi:10.1117/12.405892

2 November 2000 Phase-retrieval x-ray diffractometry in the case of high- or low-flux radiation source

Andrei Yurievich Nikulin, Peter Zaumseil

Proceedings Volume 4144, Advances in Laboratory-based X-Ray Sources and Optics; (2000) https://doi.org/10.1117/12.405892
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

An experimental-analytical technique for x-ray phase retrieval and consequent crystal structure-factor determination is tested and discussed in the cases of high- (rotating anode or synchrotron radiation) or low-flux (fixed anode x-ray tubes) radiation sources. Experimentally measurable reflectivity magnitudes, using a rotating anode or conventional x-ray tube source, affect the directly reconstructed profile of the complex crystal structure-factor. Thermal and point defect diffuse scattering contaminates the tails of the Bragg diffracted intensity. A numerical procedure developed for the regularization of the directly reconstructed complex structure-factor allows the elimination of parasitic fringes in the resulting crystal-lattice strain profiles. In addition, replacement of plus/minus infinity limits in a mathematical formalism of the reconstruction procedure by actually measured experimental values of the scattering vector in practice affects the resulting profile of the complex crystal structure factor.

Citation Download Citation

Andrei Yurievich Nikulin and Peter Zaumseil "Phase-retrieval x-ray diffractometry in the case of high- or low-flux radiation source", Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, (2 November 2000); https://doi.org/10.1117/12.405892

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