Paper
22 August 2000 Metrology for laser-structured microdevices by CCD-camera-based vision systems
Andreas Ostlender, Udo Puetz, Ernst-Wolfgang Kreutz
Author Affiliations +
Proceedings Volume 4178, MOEMS and Miniaturized Systems; (2000) https://doi.org/10.1117/12.396489
Event: Micromachining and Microfabrication, 2000, Santa Clara, CA, United States
Abstract
Recent developments in the are of micromachining and microfabrication are accelerating commercial awareness of microstructures. Product applications ranging form automotive and medical devices to industrial, chemical and consumer products show the necessity of adequate fabrication methods for microstructures. These fabrication methods include high resolution measurement technologies. Images of the machined area, recorded via videography by a CCD-camera based computer vision system are evaluated to obtain the two dimensions of the microstructured devices. Height measurement is performed by automatically focusing on two different levels of the workpiece. The achieved accuracy of the measurement data is evaluated. During structuring of microdevices an autofocus system is used to control the removal process by laser radiation to obtain the desired geometry. The mathematical algorithms used by the vision system to guide the focus of the CCD-camera are discussed. The designed measurement system is tested by microstructuring of hard metals and ceramics with short pulse laser radiation.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andreas Ostlender, Udo Puetz, and Ernst-Wolfgang Kreutz "Metrology for laser-structured microdevices by CCD-camera-based vision systems", Proc. SPIE 4178, MOEMS and Miniaturized Systems, (22 August 2000); https://doi.org/10.1117/12.396489
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KEYWORDS
CCD cameras

Process control

Machine vision

Metrology

Optical interferometry

3D metrology

Laser metrology

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