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3 October 2000 Wavelet transform and its use in edge detection
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Proceedings Volume 4220, Advanced Photonic Sensors: Technology and Applications; (2000) https://doi.org/10.1117/12.401699
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
The application of the wavelet transform to edge detection is discussed in general. In particular, two new wavelet transforms for edge detection as well as detecting the center of two edges are presented and discussed in detail. The proposed method is useful for lead inspection of surface mount devices in the electronic industry.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Feijun Song and Suganda Jutamulia "Wavelet transform and its use in edge detection", Proc. SPIE 4220, Advanced Photonic Sensors: Technology and Applications, (3 October 2000); https://doi.org/10.1117/12.401699
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