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9 October 2000 Rapid inspection method of an O-E receiver
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Proceedings Volume 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications; (2000)
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
For the first time, the rapid inspection method of an O-E receiver based on second-harmonic is proposed for measuring 1.064 micrometers and 0.91 micrometers laser pulse with duration of about 10nm. By comparing the two waveforms from a pulse of laser, we achieve more than 0.6% relative error of pulse-width. The opto- electronic receive have inspected come into use for measuring laser waveform. The measurement uncertainties of ratio of integration area to peak voltage of the laser waveform is 0.6%. It is shown that the ratio is an important parameter for evaluating the accuracy of laser waveform, in contrast, the transient time invariance and linearity of opto-electronic detector is verified.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yao Nan, Linmiao Xu, Xuanjun Jia, and Zhaojing Yang "Rapid inspection method of an O-E receiver", Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000);


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