Paper
10 October 2000 Digital fringe projection technique for high-speed 3D shape measurement
Peisen S. Huang, Chengping Zhang, Fu-Pen Chiang
Author Affiliations +
Proceedings Volume 4222, Process Control and Inspection for Industry; (2000) https://doi.org/10.1117/12.403861
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
A high-speed phase-shifting technique for 3D shape measurement has been developed and experimented. A Digital Micromirror Device (DMD) based video projector is used to project sinusoidal fringe patterns onto the object surface. Its red, green and blue (RGB) channels are programmed to be sinusoidal fringe patterns with 120-degree phase difference. The projector has a color filter with four segments, RGB and clear, which controls the color of the projected image. When a specific segment is in the light path, the DMD forms the corresponding image of that color. A 24-bit color image is formed when the RGB color channels are sequentially projected in a cycle time of 10 ms. When the color filter in the projector is removed, the DMD still projects the three color channels sequentially, but the actual projected images are now in grayscale. The timing control mechanism of the DMD is studied and a circuit is designed to provide an external timing signal for projection control. When a CCD camera used to capture the fringe patterns is synchronized with the DMD, the individual channels of RGB or the three phase-shifted fringe patterns can be captured in less than 10mn, thus making high- speed phase shifting possible. Experimental results demonstrated the feasibility of this technique for high-speed 3D shape measurement.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peisen S. Huang, Chengping Zhang, and Fu-Pen Chiang "Digital fringe projection technique for high-speed 3D shape measurement", Proc. SPIE 4222, Process Control and Inspection for Industry, (10 October 2000); https://doi.org/10.1117/12.403861
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KEYWORDS
Projection systems

3D metrology

Fringe analysis

Digital micromirror devices

Digital Light Processing

Phase shifting

Cameras

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