Paper
5 October 2000 Improvement of tapping-mode scanning near-field optical microscope
Wenjiang Zhuo, Qin Li, Jialin Sun, Jianhua Xu, Jun Zhao, Jihua Guo
Author Affiliations +
Proceedings Volume 4223, Instruments for Optics and Optoelectronic Inspection and Control; (2000) https://doi.org/10.1117/12.401792
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
The commercial crystal tuning fork glued with an optical fiber probe is used as the sensitive detecting element for the tapping-mode scanning near-field optical microscopy. Firstly, the single-mode optical fiber is etched down to a small diameter to decrease the burden of the tuning fork. Secondary, the fiber is etched for the second time to form the sharp tip with large cone angle. Thirdly, the fiber probe, with nanometric tip and high light throughput, is glued to tuning fork by Cyanoacrylate Adhesive. The measured quality factor, Q, of the tuning fork/optical fiber probe assembly prepared in this way is higher than 300. The optical signal is modulated to the frequency of the tuning fork by optical fiber probe as it is detecting the topography of sample. The high-resolution of the tapping- mode detector is proved by imaging the topography of the grating and biological cell.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wenjiang Zhuo, Qin Li, Jialin Sun, Jianhua Xu, Jun Zhao, and Jihua Guo "Improvement of tapping-mode scanning near-field optical microscope", Proc. SPIE 4223, Instruments for Optics and Optoelectronic Inspection and Control, (5 October 2000); https://doi.org/10.1117/12.401792
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KEYWORDS
Near field scanning optical microscopy

Optical fibers

Near field optics

Optical microscopes

Signal detection

Adhesives

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