Paper
5 October 2000 Wavelength measurement using dual photodetectors
Xiaodong Zeng, Shubin Wu, Yuying An
Author Affiliations +
Proceedings Volume 4223, Instruments for Optics and Optoelectronic Inspection and Control; (2000) https://doi.org/10.1117/12.401780
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
Based on the fact that the Si and InGaAs photodiodes have different spectral response curves, a new method for measuring the wavelength of laser beams is proposed. It is shown that this method is simple and reliable. The spectral resolution could be +/- 10 nm.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaodong Zeng, Shubin Wu, and Yuying An "Wavelength measurement using dual photodetectors", Proc. SPIE 4223, Instruments for Optics and Optoelectronic Inspection and Control, (5 October 2000); https://doi.org/10.1117/12.401780
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KEYWORDS
Photodetectors

Silicon

Indium gallium arsenide

Laser sources

Sensors

Spectral resolution

Halogens

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