Paper
20 October 2000 Overview of reticle enhancement technology software strategy
Alfred J. Reich, R. D. Jarvis, Steve Talent, Renee Carter
Author Affiliations +
Proceedings Volume 4226, Microlithographic Techniques in Integrated Circuit Fabrication II; (2000) https://doi.org/10.1117/12.404842
Event: International Symposium on Microelectronics and Assembly, 2000, Singapore, Singapore
Abstract
Although RET software technology has made great advances in recent years, very little attention has been paid to how this technology can be put into reliable and efficient use in a production environment. To stimulate EDA suppliers to take up this task, a system for not only automating RET, but also for generalizing the automation of RET is described.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alfred J. Reich, R. D. Jarvis, Steve Talent, and Renee Carter "Overview of reticle enhancement technology software strategy", Proc. SPIE 4226, Microlithographic Techniques in Integrated Circuit Fabrication II, (20 October 2000); https://doi.org/10.1117/12.404842
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Resolution enhancement technologies

Optical proximity correction

Electronic design automation

Reticles

Computer aided design

Photomasks

Manufacturing

RELATED CONTENT

The guideline of reticle data management (Ver. 2)
Proceedings of SPIE (June 02 2004)
Double dipole lithography for 65 nm node and beyond ...
Proceedings of SPIE (December 06 2004)
Verifying RET mask layouts
Proceedings of SPIE (July 12 2002)
The rising cost and complexity of RETs
Proceedings of SPIE (May 03 2004)
Lithography yield check for IC design
Proceedings of SPIE (May 05 2005)

Back to Top