Paper
24 October 2000 Extraction of VBIC model for SiGe HBTs made easy by going through Gummel-Poon model
Fujiang Lin, Tianshu Zhou, Bo Chen, Ban Leong Ooi, Pang Shyan Kooi
Author Affiliations +
Proceedings Volume 4228, Design, Modeling, and Simulation in Microelectronics; (2000) https://doi.org/10.1117/12.405421
Event: International Symposium on Microelectronics and Assembly, 2000, Singapore, Singapore
Abstract
A new parameter extraction methodology - local ratio evaluation is presented which is well suited for converting tone model to another. An example is given for VBIC model extraction by going through Spice Gummel-Poon (SGP) model. It is based on the fact that the VBIC model is a direct enhancement and extension of SGP model. Firstly, the standard SGP model is extracted in the standard way. Then, SGP model parameters are directly converted to VBIC model. Next, local modifications are carried out for those parameters that are affected by different equations used in the two models. Finally, new model parameters for enhanced modeling features are introduced by evaluating the difference between measurement and simulation.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fujiang Lin, Tianshu Zhou, Bo Chen, Ban Leong Ooi, and Pang Shyan Kooi "Extraction of VBIC model for SiGe HBTs made easy by going through Gummel-Poon model", Proc. SPIE 4228, Design, Modeling, and Simulation in Microelectronics, (24 October 2000); https://doi.org/10.1117/12.405421
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Cited by 3 scholarly publications.
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KEYWORDS
Capacitance

Reverse modeling

Transistors

Resistors

Statistical modeling

Diodes

Diffusion

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