Paper
6 October 2000 Measuring phase modulation characteristics of LC-SLM by using phase-shift interference
Huaixin Chen, Dahai Li, Zhenpei Chen
Author Affiliations +
Proceedings Volume 4231, Advanced Optical Manufacturing and Testing Technology 2000; (2000) https://doi.org/10.1117/12.402834
Event: International Topical Symposium on Advanced Optical Manufacturing and Testing Technology, 2000, Chengdu, China
Abstract
A simple phase-shift interference methods using a couple of double slits and a cylindrical lens are proposed to measure the phase modulation characteristics of liquid crystal spatial light modulator (LC-SLM). The experimental results employed the proposed in this paper are presented.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huaixin Chen, Dahai Li, and Zhenpei Chen "Measuring phase modulation characteristics of LC-SLM by using phase-shift interference", Proc. SPIE 4231, Advanced Optical Manufacturing and Testing Technology 2000, (6 October 2000); https://doi.org/10.1117/12.402834
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KEYWORDS
Phase shift keying

Phase modulation

Phase measurement

Liquid crystals

Modulation

Polarizers

Computer generated holography

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