PROCEEDINGS VOLUME 4285
SYMPOSIUM ON INTEGRATED OPTICS | 20-26 JANUARY 2001
Testing, Reliability, and Applications of Optoelectronic Devices
Editor Affiliations +
SYMPOSIUM ON INTEGRATED OPTICS
20-26 January 2001
San Jose, CA, United States
Control, Ranging, Illumination, and High-Power Applications
D. R. Pendse, Aland K. Chin, D. Bull, J. Maider
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426873
Jeffrey T. Remillard, Willes H. Weber, Timothy Fohl
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426882
Eduard K. Mueller, Susanne M. Lee, Brian C. Van de Workeen, Otward M. Mueller
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426890
Juha Tapio Kostamovaara, Antti Maentyniemi, Pasi J. M. Palojaervi, Tero Peltola, Tarmo Ruotsalainen, Elvi Raeisaenen-Ruotsalainen
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426895
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426896
Xiaorong Gao
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426897
Sensor and Spectroscopy Applications
Jeng-Ya Yeh, Suwandi Rusli, Soraya Pornsuwan, Albena Ivanisevic, Anne-Marie Nickel, Arthur B. Ellis, Thomas F. Kuech, Luke J. Mawst
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426898
Audra Michelle Bullock, James M. Barrington, Amin N. Dharamsi
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426899
Shintaro Hisatake, Masahrio Fukushima, Yoshihiro Kurokawa, Wakao Sasaki
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426900
Kyung-Chan Kim, SeBaek Oh, Soo Hyun Kim, Yoon Keun Kwak
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426874
SeBaek Oh, Kyung-Chan Kim, Soo Hyun Kim, Yoon Keun Kwak
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426875
Boris A. Matveev, Meyrhan Aydaraliev, Nonna V. Zotova, Sergey A. Karandashev, Maxim A. Remennyi, Nikolai M. Stus', Georgii N. Talalakin, Volodymyr K. Malyutenko, Oleg Yu. Malyutenko
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426876
Poster Session
Tudor Zisu, Sorin Miclos
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426877
Tudor Zisu, Sorin Miclos
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426878
Xiaorong Gao, Li Wang
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426879
Diode Lasers and Reliability
Luke J. Mawst, Delai Zhou
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426880
Junji Yoshida, Naoki Tsukiji, Akinobu Nakai, Toru Fukushima, Akihiko Kasukawa
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426881
Yao Zou, Erik P. Zucker, Kushant Uppal, Debbie L. Coblentz, Pamela X. Liang, Matthew G. Peters, Richard R. Craig
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426883
Konstantin Boucke, Juergen Jandeleit, Wolfgang Brandenburg, Andreas Ostlender, Peter Loosen, Reinhart Poprawe
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426884
Laser Modules
Richard B. Bylsma, Leonard J. P. Ketelsen, David A. Ackerman, John E. Johnson, Kishore K. Kamath, E. J. Dean, Waleed A. Asous, J. Michael Geary, Eric Mak, et al.
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426885
Christopher L. Chua, David K. Fork, Donald L. Smith
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426886
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426887
Optoelectronic Device and Modules
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426888
Patricia F. Mead, Yubing Yang, Melody Burch, Patrick McCluskey, F. G. Johnson
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426889
Optoelectronic Device Testing
Robert G. Ahrens, James J. Jaques, Michael J. LuValle, David J. DiGiovanni, Robert S. Windeler
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426891
Niloy Choudhury, Anguel N. Nikolov, Niloy K. Dutta
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426892
Xiankun Xin, Guang Ci Cao
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426893
Stefano Pelizzari, Luigi Rovati, C. De Angelis
Proceedings Volume Testing, Reliability, and Applications of Optoelectronic Devices, (2001) https://doi.org/10.1117/12.426894
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