Linewidth evaluation in VCSELs

Pierluigi De Bernardis; Gian Paolo Bava; Laura Fratta

doi:10.1117/12.424810

4 May 2001 Linewidth evaluation in VCSELs

Pierluigi De Bernardis, Gian Paolo Bava, Laura Fratta

Proceedings Volume 4286, Vertical-Cavity Surface-Emitting Lasers V; (2001) https://doi.org/10.1117/12.424810
Event: Symposium on Integrated Optics, 2001, San Jose, CA, United States

Abstract

We present a model to compute the linewidth in vertical-cavity surface-emitting lasers, accounting for the 3D-structure of real devices. To this aim we include the noise source in the field equations and treat both the noise and the structural characteristics by means of coupled mode theory. In this way we obtain an expression for the linewidth that is given as the standard relation, modified by two correction factors that account for spatial effects and modal dispersion of the resonator. In the numerical results we give some guidelines towards devices aimed to narrow-line emission and, as a significant example, we study the transition from gain to index-guided devices in oxide-confined VCSEL's.

Citation Download Citation

Pierluigi De Bernardis, Gian Paolo Bava, and Laura Fratta "Linewidth evaluation in VCSELs", Proc. SPIE 4286, Vertical-Cavity Surface-Emitting Lasers V, (4 May 2001); https://doi.org/10.1117/12.424810

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