Paper
6 June 2001 Beam quality of mid-infrared angled-grating distributed-feedback lasers
William W. Bewley, Igor Vurgaftman, Robert E. Bartolo, Michael J. Jurkovic, Christopher L. Felix, Jerry R. Meyer, Hao Lee, Ramon U. Martinelli, George W. Turner, M. J. Manfra
Author Affiliations +
Abstract
We have studied the far-field characteristics of mid- infrared angled-grating distributed feedback ((alpha) -DFB) lasers with W active regions as a function of etch depth, stripe width, and optical pumping intensity. Whereas near- diffraction-limited output is obtained for 50 micrometers stripes at 10 times threshold, the beam quality degrades rapidly when either the stripe width or the pump intensity is increased. A key finding is that most of the degradation may be attributed to the onset of Fabry-Perot-like lasing modes that propagate along the direct path normal to the facets. We further show that these parasitic modes may be effectively eliminated by using ion bombardment to create angled virtual mesas surrounded by loss regions. The bombarded structures show substantial improvement of the beam quality for wide pump stripes and high pump intensities, with only a modest reduction in the efficiency.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William W. Bewley, Igor Vurgaftman, Robert E. Bartolo, Michael J. Jurkovic, Christopher L. Felix, Jerry R. Meyer, Hao Lee, Ramon U. Martinelli, George W. Turner, and M. J. Manfra "Beam quality of mid-infrared angled-grating distributed-feedback lasers", Proc. SPIE 4287, In-Plane Semiconductor Lasers V, (6 June 2001); https://doi.org/10.1117/12.429803
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KEYWORDS
Etching

Mid-IR

Fabry–Perot interferometers

Ions

Diffraction gratings

Laser damage threshold

Antimony

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