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21 December 2000 Estimating scanning characteristics from corners in bilevel images
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Proceedings Volume 4307, Document Recognition and Retrieval VIII; (2000) https://doi.org/10.1117/12.410835
Event: Photonics West 2001 - Electronic Imaging, 2001, San Jose, CA, United States
Abstract
Degradations that occur during scanning can cause errors in Optical Character Recognition (OCR). Scans made in bilevel mode (no gray scale) from high contrast source patterns are the input to the estimation processes. Two scanner system parameters are estimated from bilevel scans using models of the scanning process and bilevel source patterns. The scanner's point spread function (PSF) width and the binarization threshold are estimated by using corner features in the scanned images. These estimation algorithms were tested in simulation and with scanned test patterns. The resulting estimates are close in value to what is expected based on gray-level analysis. The results of estimation are used to produce synthetically scanned characters that in most cases bear a strong resemblance to the characters scanned on the scanner at the same settings as the test pattern used for estimation.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Elisa H. Barney Smith "Estimating scanning characteristics from corners in bilevel images", Proc. SPIE 4307, Document Recognition and Retrieval VIII, (21 December 2000); https://doi.org/10.1117/12.410835
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