Paper
13 June 2001 Measurement of angle of rotation using circular optical grating
Huai Min Shang, Siew-Lok Toh, Yu Fu, Chenggen Quan, Cho Jui Tay
Author Affiliations +
Proceedings Volume 4317, Second International Conference on Experimental Mechanics; (2001) https://doi.org/10.1117/12.429549
Event: Second International Conference on Experimental Mechanics, 2000, Singapore, Singapore
Abstract
In this paper, a simple method is described for the measurement of small angles of rotation of a flat surface using a circular optical grating, which may be generated and projected onto the test surface using either a standard Michelson interferometer or a computer-controlled LCD projector. In view of its availability in most laboratories, a Michelson interferometer is used in this paper. The diameter of the grating that is generated can be easily magnified or be reduced to suit the size of the test surface. With circular grating, the angular rotation of both diffuse and specularly reflective surface about any axis of rotation can be measured from the distortion of the grating. The distorted grating that is diffracted from a specularly reflective surface may be recorded in two different ways using a CCD camera. In the first method, the distorted grating is recorded off the m mirror surface as though it were a diffuse surface. In the second method, the distorted grating is recorded off the miro surface as though it were a diffuse surface. In the second method, the distorted grating is specularly reflected onto an opaque screen and the CCD camera subsequently records the grating image off this screen.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huai Min Shang, Siew-Lok Toh, Yu Fu, Chenggen Quan, and Cho Jui Tay "Measurement of angle of rotation using circular optical grating", Proc. SPIE 4317, Second International Conference on Experimental Mechanics, (13 June 2001); https://doi.org/10.1117/12.429549
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KEYWORDS
Reflectivity

Michelson interferometers

Distortion

Silicon

CCD cameras

Mirrors

Calibration

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