Paper
13 June 2001 Phase-shifting projection moire for out-of-plane displacement measurement
Moon-sik Jeong, Seung-Woo Kim
Author Affiliations +
Proceedings Volume 4317, Second International Conference on Experimental Mechanics; (2001) https://doi.org/10.1117/12.429566
Event: Second International Conference on Experimental Mechanics, 2000, Singapore, Singapore
Abstract
We present a special scheme of projection moire topography that is particularly intended to implement out-of-plane displacement measurement in non-contact mode for experimental analysis of static deflection and dynamic vibration. A pair of gratings constitute the primary component of measurement; one is for protection a line pattern on the target surface while the other is for generating moire fringes by imaging to itself the deformed line pattern projected on the target. For the whole measurement, two sets of four pairs of gratings are used in sequence, which offer four different phase shifts in dual frequency mode in the generation moire fringes. The fringes are captured in real time by a CCD camera and processed within an IBM PC by incorporating phase-shifting fringe analysis, so that 3D coordinates of the target surface are finally obtained by unwrapping the measured phases of fringes.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Moon-sik Jeong and Seung-Woo Kim "Phase-shifting projection moire for out-of-plane displacement measurement", Proc. SPIE 4317, Second International Conference on Experimental Mechanics, (13 June 2001); https://doi.org/10.1117/12.429566
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Cited by 13 scholarly publications.
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KEYWORDS
Moire patterns

Phase shifting

3D metrology

Phase shifts

Fringe analysis

Magnesium

3D modeling

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