Polarimetric sensors for damage detection of aluminum materials

Wee Meng Chang; Poh Kok Ng; Su-fern Shirin Sng; Jianjun Ma; Anand Krishna Asundi; Jayanth Puttappa

doi:10.1117/12.429577

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13 June 2001 Polarimetric sensors for damage detection of aluminum materials

Wee Meng Chang, Poh Kok Ng, Su-fern Shirin Sng, Jianjun Ma, Anand Krishna Asundi, Jayanth Puttappa

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Proceedings Volume 4317, Second International Conference on Experimental Mechanics; (2001) https://doi.org/10.1117/12.429577
Event: Second International Conference on Experimental Mechanics, 2000, Singapore, Singapore

Abstract

A PFOS for monitoring and detecting damages in aluminum specimen has been demonstrated. It has been shown that PFOS can be used to monitor the development of cracks and predict residual load on aluminum structures. The experimental result obtained is very consistent and the sensor is immune to temperature changes and electromagnetic interference, as it does not require a reference are more accurate for damage detection. Some of the features such as low cost, durable, light weight and real-time applications of PFOS have been highlighted.

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Wee Meng Chang, Poh Kok Ng, Su-fern Shirin Sng, Jianjun Ma, Anand Krishna Asundi, and Jayanth Puttappa "Polarimetric sensors for damage detection of aluminum materials", Proc. SPIE 4317, Second International Conference on Experimental Mechanics, (13 June 2001); https://doi.org/10.1117/12.429577

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