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28 June 2001 Deposition of thick films of polycrystalline mercuric iodide x-ray detectors
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Abstract
We report x-ray imaging results on polycrystalline HgI2 detector used for direct x-ray imaging. Due to its good electrical properties and high stopping power for x-rays and gamma rays, the material is a good candidate for many applications in medical imaging. The deposition of the HgI2 thick films is made by hot wall physical vapor deposition, (PVD) method and some of the structural features are described here. The x-ray response and some dark current data measured on some recently prepared detectors are reported. Some results obtained with poly-HgI2 thin film deposited on an amorphous-Si TFT's imaging array 4' X 4' performed at the Ginzton Technology Center is reported for the first time. Also phantom images received with a similar deposited poly-HgI2 thin film deposited on an amorphous- Si TFT's imaging array 2' X 2' performed at Xerox-PARC Research Center is also given here. The status of HgI2 technology will be discussed.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haim Hermon, Michael M. Schieber, Asaf Zuck, Alexander I. Vilensky, Leonid Melekhov, E. Shtekel, A. K. Green, O. Dagan, Steve E. Ready, Robert A. Street, E. Seppi, Raisa Pavlyuchkova, G. Virshup, G. Zentai, and L. Partain "Deposition of thick films of polycrystalline mercuric iodide x-ray detectors", Proc. SPIE 4320, Medical Imaging 2001: Physics of Medical Imaging, (28 June 2001); https://doi.org/10.1117/12.430922
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