Paper
11 July 2001 Modeling cyclic fatigue phenomena of polycrystalline ferroelectric ceramics
Johannes Roedel, Wolfgang S. Kreher
Author Affiliations +
Abstract
The degradation of ferroelectric properties (polarization and remnant strain) during cycling of piezoelectric ceramics limits the reliability and applicability of such materials. This ferroelectric fatigue is believed to be caused by domain wall pinning and grain boundary microcracking. In this paper we concentrate on the domain wall pinning effect. The analysis is based on a self-consistent non-linear micro-mechanical model. The particular domain model applies to loading situations according to quasistatic unipolar cycling. Internal fields on the grain level and stored internal energy can be calculated using the solution of the piezoelectric inclusion problem. Nonlinear material response and hysteresis is caused by rearrangement of ferroelectric domain walls which leads to relaxation of internal fields. According to a thermodynamic criterion, domain wall motion takes place if the energy release rate is equal to a critical value. The proposed model assumes that the critical energy release rate is coupled with a microscopic, history dependent internal variable. Thus the evolution of the internal variable determines the fatigue process. Decreasing relaxation of internal fields causes increase of stored energy which could be discussed in relation to the onset of additional fatigue mechanisms like microcracking.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Johannes Roedel and Wolfgang S. Kreher "Modeling cyclic fatigue phenomena of polycrystalline ferroelectric ceramics", Proc. SPIE 4333, Smart Structures and Materials 2001: Active Materials: Behavior and Mechanics, (11 July 2001); https://doi.org/10.1117/12.432764
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Cited by 2 scholarly publications.
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KEYWORDS
Dielectric polarization

Crystals

Dielectrics

Ceramics

Motion models

Thermodynamics

Ferroelectric materials

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