Structural perfection diagnostics of narrow-gap photosensitive semiconductor junctions by electron diffraction

Alexandr D. Britov; Alexander I. Dirochka; Pavel S. Serebrennikov; N. A. Suleimanov; A. S. Kononov; Igor P. Suprun

doi:10.1117/12.407740

28 November 2000 Structural perfection diagnostics of narrow-gap photosensitive semiconductor junctions by electron diffraction

Alexandr D. Britov, Alexander I. Dirochka, Pavel S. Serebrennikov, N. A. Suleimanov, A. S. Kononov, Igor P. Suprun

Author Affiliations +

Proceedings Volume 4340, 16th International Conference on Photoelectronics and Night Vision Devices; (2000) https://doi.org/10.1117/12.407740
Event: XVI International Conference on Photoelectronics and Night Vision Devices, 2000, Moscow, Russian Federation

Abstract

In the work are studied structural, electrical and optical properties of film heterojunctions p-Pb_1-xSn_xTe-n- PbTe obtained by condensation of molecular beams in vacuum approximately 10^-6mm mercury pressure. It is determined that diffusion fringes intensity on diffraction patterns are different depending on thickness of films (d) and temperature of films growing (T_f). The intensity of diffusion fringes also depends on survey temperature (T_s). The correlation between intensity of diffusion fringes on electron diffraction patterns and photosensitivity of heterojunctions Pb_1-xSn_xTe-PbTe is found.

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Alexandr D. Britov, Alexander I. Dirochka, Pavel S. Serebrennikov, N. A. Suleimanov, A. S. Kononov, and Igor P. Suprun "Structural perfection diagnostics of narrow-gap photosensitive semiconductor junctions by electron diffraction", Proc. SPIE 4340, 16th International Conference on Photoelectronics and Night Vision Devices, (28 November 2000); https://doi.org/10.1117/12.407740

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