Paper
12 April 2001 Photochemical polishing of fused-silica optics by using ArF excimer laser
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Abstract
Polishing of fused silica micro optics was demonstrated without polishing dummy by using an ArF excimer laser and water solution. A fused silica glass sample was placed on the fluorocarbon grinding turntable. And the water solution was poured into a thin gap between the sample and fluorocarbon surface by capillary phenomenon. And a patterned ArF excimer laser light was irradiated on the fluorocarbon surface through the fused silica sample surface at the laser fluence of 15 mJ/cm2. By this photo irradiation, the water and fluorocarbon surface were photo- dissociated and produced hydrofluoric acid locally. By the hydrofluoric acid, the silica glass surface which were contacted with the hydrofluoric acid and fluorocarbon surface was etched. As a result, the only photo irradiated part of the silica glass sample was polished effectively.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masataka M. Murahara "Photochemical polishing of fused-silica optics by using ArF excimer laser", Proc. SPIE 4347, Laser-Induced Damage in Optical Materials: 2000, (12 April 2001); https://doi.org/10.1117/12.425067
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Cited by 3 scholarly publications and 1 patent.
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KEYWORDS
Polishing

Silica

Surface finishing

Excimer lasers

Glasses

Chemical species

Epoxies

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