Recent developments in electronic speckle pattern interferometry

Krzysztof Patorski

doi:10.1117/12.417816

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7 March 2001 Recent developments in electronic speckle pattern interferometry

Krzysztof Patorski

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Proceedings Volume 4356, 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics; (2001) https://doi.org/10.1117/12.417816
Event: 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2000, Velke Losiny, Czech Republic

Abstract

Electronic speckle pattern interferometry pioneered 30 years ago, represents one of the most powerful tools for industrial nondestructive testing and metrology. Main advantages include speed of data acquisition and processing, relative simplicity and possibility to work outside the laboratory. Steady progress in optoelectronics, fiber technology, and informatics facilitates the development of compact and robust systems for new tasks in engineering analysis.

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Krzysztof Patorski "Recent developments in electronic speckle pattern interferometry", Proc. SPIE 4356, 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, (7 March 2001); https://doi.org/10.1117/12.417816

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