Paper
23 March 2001 Synchronizing the IR camera to capture high-speed thermal transients
Author Affiliations +
Abstract
Thermal transients caused by electrical switching devices and fast optical or electrical pulses only exist for a very short time (less than 1 millisecond). If the transient happens in a high thermal conductivity material, e.g. silicon wafer, the thermal transient will disappear in a few milliseconds or faster. Most modern IR cameras have external triggering capability. However, the IR camera often runs on its own clock. If the triggering of data acquisition is not synchronized with the camera, there is often an uncertainty of timing, e.g. 16.7 ms for camera running at 60Hz. Even when the IR camera is running at 500 Hz, there is 2 ms uncertainty. Depending on when you push/click the button, the high-speed thermal transients can be missed and they will disappear in the next image. We developed a technique to synchronize the IR camera to capture the thermal transients. By using a delay function, we can control the data acquisition very precisely to study the thermal transients.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hsin Wang and Ralph B. Dinwiddie "Synchronizing the IR camera to capture high-speed thermal transients", Proc. SPIE 4360, Thermosense XXIII, (23 March 2001); https://doi.org/10.1117/12.421024
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KEYWORDS
Cameras

Infrared cameras

Clocks

Thermography

High speed cameras

Image acquisition

Infrared imaging

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