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31 August 2001 MIRAGE emitter improvements & technology review
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With the increased demand for IR sensor and surveillance systems, there is a growing need for technologies to support their operational readiness. Measurement of sensor characteristics such as sensitivity, MRTD, and dynamic range should be standard in all mission critical systems. The Real-Time Infrared Test Set (RTIR) is a portable system designed to provide in-the-field calibration and testing of IR imaging systems and seekers. RTIR uses the high volume manufacturing processes of the Very Large Scale Integration (VLSI) and the Micro Electromechanical Systems (MEMS) technology to produce a Thermal Pixel Array (TPA). State-of-the-art CMOS processes define all the necessary on-chip digital and analog electronics. When properly driven, this array generates variable temperature,synthetic IR scenes. A nonuniformity measurement of several TPAs is presented.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Steven Lawrence Solomon, Alan Irwin, Jim Oleson, Kevin Sparkman, Anthony M. Gallagher, William Lin, and Jianmei Pan "MIRAGE emitter improvements & technology review", Proc. SPIE 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI, (31 August 2001);

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