Advances in full-face full-complex SLM characterization

Stanley E. Monroe Jr.; John Michael Rollins; Richard D. Juday

doi:10.1117/12.421153

20 March 2001 Advances in full-face full-complex SLM characterization

Stanley E. Monroe Jr., John Michael Rollins, Richard D. Juday

Proceedings Volume 4387, Optical Pattern Recognition XII; (2001) https://doi.org/10.1117/12.421153
Event: Aerospace/Defense Sensing, Simulation, and Controls, 2001, Orlando, FL, United States

Abstract

If an optical correlator is to perform at full potential, the filtersmith must know what complex action will result from the control he applies to the filter SLM. If the SLM is spatially variant (and all are, to some degree or other), the behavior may be different at every frequency plane pixel. We have previously reported characterization of the full-complex behavior at every pixel of the SLM. We have refined the method in two distinct ways: we are doing multi- step interferometry (rather than only phase quadrature), and we have significantly improved the isolation of an individual pixel's complex action.

Citation Download Citation

Stanley E. Monroe Jr., John Michael Rollins, and Richard D. Juday "Advances in full-face full-complex SLM characterization", Proc. SPIE 4387, Optical Pattern Recognition XII, (20 March 2001); https://doi.org/10.1117/12.421153

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