Nonlinear features for improved pattern recognition

David P. Casasent; Ashit Talukder

doi:10.1117/12.432795

6 July 2001 Nonlinear features for improved pattern recognition

David P. Casasent, Ashit Talukder

Proceedings Volume 4392, Optical Processing and Computing: A Tribute to Adolf Lohmann; (2001) https://doi.org/10.1117/12.432795
Event: Aerospace/Defense Sensing, Simulation, and Controls, 2001, Orlando, FL, United States

Abstract

Nonlinear features that represent higher-order correlations in input data are considered for improved recognition. They optimize new performance measures that do not make Gaussian etc. data distribution assumptions and that are intended for improved discrimination. The new features are produced in closed-form and are thus preferable to iterative solutions. An efficient two-step feature extraction algorithm is presented for the high-dimensional (iconic) input data case of most interest. The feature generation can be realized as a new neural network with adaptive activation functions. Test results on pose-invariant face recognition are emphasized; results on standard feature inputs for a product inspection application are briefly noted as a low- dimensional input data case.

Citation Download Citation

David P. Casasent and Ashit Talukder "Nonlinear features for improved pattern recognition", Proc. SPIE 4392, Optical Processing and Computing: A Tribute to Adolf Lohmann, (6 July 2001); https://doi.org/10.1117/12.432795

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