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17 April 2001 Electrical conductivity of the ZnS:Mn,Cu thin films
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Electrical properties of the electroluminescent thin film cells based on zinc sulfide were investigated. Current-voltage characteristics for whole electroluminescent cell and part of the cell were measured at room temperature. Current-voltage characteristics due to part of the cell were performed by point contact tunneling method. In both the kind of current-voltage characteristics memory effect has been observed. Different mechanisms of the charge transport through the cells and thin ZnS:Mn,Cu films were taken into account. We have found that it is more than one mechanism of electrical conductivity in the thin films.
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Bronislaw Susla, Eugeniusz Chimczak, Maciej Kaminski, Miroslawa Bertrandt-Zytkowiak, and Grazyna Neunert "Electrical conductivity of the ZnS:Mn,Cu thin films", Proc. SPIE 4413, International Conference on Solid State Crystals 2000: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, (17 April 2001);

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