Measurement of spatial coherence of a superluminescent diode using an interferometer with double slit

Noritaka Negi; Hirotsugu Yamamoto; Yoshio Hayasaki; Nobuo Nishida

doi:10.1117/12.427090

8 May 2001 Measurement of spatial coherence of a superluminescent diode using an interferometer with double slit

Noritaka Negi, Hirotsugu Yamamoto, Yoshio Hayasaki, Nobuo Nishida

Proceedings Volume 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001); (2001) https://doi.org/10.1117/12.427090
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '01), 2001, Yokohama, Japan

Abstract

The purpose of this study is to investigate spatial coherence of superluminescent diode (SLD). In order to measure the spatial coherence, we use an interferometer with double slit. The relation between visibility of the fringe and the diffraction length are reported. Furthermore, difference in spatial coherence between SLD and LED is discussed.

Citation Download Citation

Noritaka Negi, Hirotsugu Yamamoto, Yoshio Hayasaki, and Nobuo Nishida "Measurement of spatial coherence of a superluminescent diode using an interferometer with double slit", Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001); https://doi.org/10.1117/12.427090

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